Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf0.5Zr0.5O2 Capacitors

Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf0.5Zr0.5O2 Capacitors

: Journal Publications

Published in Advanced Materials Interfaces (06 September 2019)

DOI: https://doi.org/10.1002/admi.201901180

By Furqan Mehmood, Michael Hoffmann, Patrick D. Lomenzo, Claudia Richter, Monica Materano, Thomas Mikolajick, and Uwe Schroeder

The full paper can be found here:

https://www.researchgate.net/publication/335670957