Published in IEEE Journal of the Electron Devices Society (11 August 2022)
DOI: 10.1109/JEDS.2022.3198138
By R. Alcala, M. Materano, P.D. Lomenzo, L. Grenouillet, T. Francois, J. Coignus, N. Vaxelaire, C. Carabasse, S. Chevalliez, F. Andrieu, T. Mikolajick, and U. Schroeder