Journal Publications

Intrinsic or nucleation-driven switching: An insight from nanoscopic analysis of negative capacitance Hf1−xZrxO2-based structures

: Journal Publications

Published in Applied Physics Letters (26 October 2020)

DOI: 10.1063/5.0021272

By I. Stolichnov, M. Cavalieri, C. Gastaldi, M. Hoffmann, U. Schroeder, T. Mikolajick, and A. M. Ionescu

Surface relaxation and rumpling of Sn-doped β − Ga2O3 (010)

: Journal Publications

Published in Physical Review B (29 December 2020)

DOI: 10.1103/PhysRevB.102.245306

By A. Pancotti, T. C. Back, W. Hamouda, M. Lachheb, C. Lubin, P. Soukiassian, J. Boeckl, D. Dorsey, S. Mou, T. Asel, G. Geneste, and N. Barrett

Perspective on ferroelectric, hafnium oxide based transistors for digital beyond von-Neumann computing

: Journal Publications

Published in Applied Physics Letters (4 February 2021)

DOI: 10.1063/5.0035281

By Evelyn T. Breyer, Halid Mulaosmanovic, Thomas Mikolajick, and Stefan Slesazeck

The Role of Interface Defect States in n- and p-Type Ge Metal–Ferroelectric–Semiconductor Structures with Hf0.5Zr0.5O2 Ferroelectric

: Journal Publications

Published in physica status solidi (a) (19 December 2020)

DOI: 10.1002/pssa.202000500

By Georgia Andra Boni, Cosmin M. Istrate, Christina Zacharaki, Polychronis Tsipas, Stefanos Chaitoglou, Evangelos K. Evangelou, Athanasios Dimoulas, Ioana Pintilie, and Lucian Pintilie

Impact of area scaling on the ferroelectric properties of back-end of line compatible Hf0.5Zr0.5O2 and Si:HfO2-based MFM capacitors

: Journal Publications

Published in Applied Physics Letters (12 February 2021)

DOI: 10.1063/5.0035650

By T. Francois, L. Grenouillet, J. Coignus, N. Vaxelaire, C. Carabasse, F. Aussenac, S. Chevalliez, S. Slesazeck, C. Richter, P. Chiquet, M. Bocquet, U. Schroeder, T. Mikolajick, F. Gaillard, and E. Nowak