Journal Publications

Chemical Stability of IrO2 Top Electrodes in Ferroelectric Hf0.5Zr0.5O2-Based Metal–Insulator–Metal Structures: The Impact of Annealing Gas

: Journal Publications

Published in physica status solidi (RRL) – Rapid Research Letters (23 February 2021)

DOI: 10.1002/pssr.202100027

By Thomas Szyjka, Lutz Baumgarten, Terence Mittmann, Yury Matveyev, Christoph Schlueter, Thomas Mikolajick, Uwe Schroeder, and Martina Müller

Impact of Iridium Oxide Electrodes on the Ferroelectric Phase of Thin Hf0.5Zr0.5O2 Films

: Journal Publications

Published in physica status solidi (RRL) – Rapid Research Letters (26 February 2021)

DOI: 10.1002/pssr.202100012

By Terence Mittmann, Thomas Szyjka, Hsain Alex, Marian Cosmin Istrate, Patrick D. Lomenzo, Lutz Baumgarten, Martina Müller, Jacob L. Jones, Lucian Pintilie, Thomas Mikolajick, and Uwe Schroeder

Intrinsic switching in Si-doped HfO2: A study of Curie–Weiss law and its implications for negative capacitance field-effect transistor

: Journal Publications

Published in Applied Physics Letters (12 May 2021)

DOI: https://doi.org/10.1063/5.0052129

By Carlotta Gastaldi, Matteo Cavalieri, Ali Saeidi, Eamon O'Connor, Sadegh Kamaei, Teodor Rosca, Igor Stolichnov, and Adrian Mihai Ionescu

Impact of vacancies and impurities on ferroelectricity in PVD- and ALD-grown HfO2 films

: Journal Publications

Published in Applied Physics Letters (19 January 2021)

DOI: https://doi.org/10.1063/5.0035686

By Lutz Baumgarten, Thomas Szyjka, Terence Mittmann, Monica Materano, Yury Matveyev, Christoph Schlueter, Thomas Mikolajick, Uwe Schroeder, and Martina Müller

Imprint issue during retention tests for HfO2-based FRAM: An industrial challenge?

: Journal Publications

Published in Applied Physics Letters (23 February 2021)

DOI: https://doi.org/10.1063/5.0035687

By J. Bouaziz, P. Rojo Romeo, N. Baboux, and B. Vilquin

The full paper can be found here: https://hal.archives-ouvertes.fr/hal-03177059