|
FeFET: A versatile CMOS compatible device with game-changing potential
|
18 September 2020 |
|
New Insights into the Imprint Effect in FE-HfO2 and its Recovery
|
18 September 2020 |
|
Implementation of Dopant-Free Hafnium Oxide Negative Capacitance Field-Effect Transistor
|
11 January 2019 |
|
Regulating crystal structure and ferroelectricity in Sr doped HfO2 thin films fabricated by metallo-organic decomposition
|
11 January 2019 |
|
Time Response of Polarization Switching in Ge Hafnium Zirconium Oxide Nanowire Ferroelectric Field-effect Transistors
|
11 January 2019 |
|
Thermal resistance and heat capacity in hafnium zirconium oxide (Hf1–xZrxO2) dielectrics and ferroelectric thin films
|
11 January 2019 |
|
Ferroelectric Tunnel Junctions based on Ferroelectric-Dielectric Hf0.5Zr0.5.O2/ Al2O3 Capacitor Stacks
|
11 January 2019 |
|
Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films
|
11 January 2019 |
|
Impact of Zirconium Doping on Steep Subthreshold Switching of Negative Capacitance Hafnium Oxide Based Transistors
|
11 January 2019 |
|
Nanoscopic studies of domain structure dynamics in ferroelectric La:HfO2 capacitors
|
09 November 2018 |
|
On the relationship between field cycling and imprint in ferroelectric Hf0.5Zr0.5O2
|
09 November 2018 |
|
Effect of Annealing Ferroelectric HfO2 Thin Films: In Situ, High Temperature X‐Ray Diffraction
|
09 November 2018 |
|
Al-, Y-, and La-doping effects favoring intrinsic and field induced ferroelectricity in HfO2: A first principles study
|
09 November 2018 |
|
Interplay between ferroelectric and resistive switching in doped crystalline HfO2
|
09 November 2018 |
|
Analysis of performance instabilities of Hafnia‐based ferroelectrics using modulus spectroscopy and thermally stimulated depolarization currents
|
09 November 2018 |
|
Atomic Structure of Domain and Interphase Boundaries in Ferroelectric HfO2
|
09 November 2018 |
|
Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors with Low-Voltage Operation and High Reliability for Next-Generation FRAM Applications
|
30 October 2018 |
|
Genuinely Ferroelectric Sub-1-Volt-Switchable Nanodomains in HfxZr(1–x)O2 Ultrathin Capacitors
|
12 October 2018 |
|
Silicon doped hafnium oxide (HSO) and hafnium zirconium oxide (HZO) based FeFET: A material relation to device physics
|
11 October 2018 |
